An Engineer's Guide to Automated Testing of High-Speed by Jose Moreira

By Jose Moreira

Offering a whole creation to the state of the art in high-speed electronic trying out with automatic try out gear (ATE), this useful source is the 1st ebook to concentration solely in this more and more vital subject. that includes transparent examples, this one-stop reference covers all serious features of the topic, from high-speed electronic fundamentals, ATE instrumentation for electronic purposes, and attempt and measurements, to construction checking out, help instrumentation and textual content fixture layout.

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Extra info for An Engineer's Guide to Automated Testing of High-Speed Interfaces

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In this case there is no DfT mechanism available to help with measuring the I/O cell BER. The BER must then be measured by analyzing all relevant inputs/outputs of the DUT. , [10]). 20. Typically this is more of a system test than an IC test performed with an ATE system. 20 Block diagram of a bit error rate setup measurement for a digital link. 4 Jitter Jitter and jitter testing are very important but sometimes complex subjects. There exists a myriad of resources spread through different books, articles, and applications notes.

34 Comparison of the jitter spectrum obtained from a digital signal with only random jitter (left) and a signal with random jitter and a periodic jitter component in the form of sinusoidal jitter at 100 MHz (right). 31. 35 Comparison of the jitter spectrum obtained from a digital signal with random jitter and deterministic jitter (left) in the form of ISI and a signal with deterministic jitter in the form of BUJ (right). In this case it is easy to observe that for ISI type deterministic jitter, the jitter spectrum is composed of several discrete lines at multiple frequencies.

12 shows the time and frequency domain views for a “perfect” digital signal, real signals are not perfect. 13 shows a real 10 Gbps signal with a PRBS 27 − 1 data pattern (see Appendix C) measured 18 An Engineer’s Guide to Automated Testing of High-Speed Interfaces on the time domain with an equivalent-time sampling oscilloscope and in the frequency domain with a spectrum analyzer (see Chapter 7). 13 Viewing a high-speed digital signal on the time domain (left) and frequency domain (right). The time domain measurement is in the form of a data eye diagram showing a signal with a fast rise time (30 ps 20/802 with a good “open eye”).

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